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In situ transmission electron microscopy employed for studies of effects of ion and electron irradiation on materials
Author(s) -
Allen Charles W.,
Ryan Edward A.
Publication year - 1998
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/(sici)1097-0029(19980915)42:4<255::aid-jemt4>3.0.co;2-p
Subject(s) - in situ , transmission electron microscopy , irradiation , electron microscope , materials science , nanotechnology , electron beam processing , chemistry , optics , physics , nuclear physics , organic chemistry
This paper summarizes the essential features of the various facilities dedicated to in situ irradiation effects research around the world at the present time, mentions some essential techniques that are involved in this type of research, and describes very briefly some examples of studies employing these facilities and techniques. Microsc. Res. Tech. 42:255–259, 1998. © 1998 Wiley‐Liss, Inc.