z-logo
Premium
ESEM observation of thermal shock cracking
Author(s) -
Corbellani Cristina E.,
Alejandro Gabriela,
Topolevsky Raúl B.
Publication year - 1997
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/(sici)1097-0029(19970901)38:5<525::aid-jemt10>3.0.co;2-o
Subject(s) - environmental scanning electron microscope , cracking , shock (circulatory) , scanning electron microscope , materials science , thermal shock , composite material , radiology , medicine
We report a simple method for a quick and efficient localization of thermal shock cracks as narrow as 1 μm or less, using Environmental Scanning Electron Microscopy (ESEM). The non‐destructive character of the technique is exploited in order to observe relevant fractographic features of the crack pattern. Microsc. Res. Tech. 38:525–528, 1997. © 1997 Wiley‐Liss, Inc.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here