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Preparation of multilayered materials in cross‐section for in situ TEM tensile deformation studies
Author(s) -
Wall Mark A.,
Barbee, Jr. Troy W.,
Weihs Timothy P.
Publication year - 1997
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/(sici)1097-0029(19970201)36:3<143::aid-jemt1>3.0.co;2-q
Subject(s) - foil method , ultimate tensile strength , materials science , deformation (meteorology) , transmission electron microscopy , cross section (physics) , in situ , section (typography) , composite material , nucleation , tensile testing , nanotechnology , chemistry , computer science , physics , organic chemistry , quantum mechanics , operating system
The success of in situ transmission electron microscopy experimentation is often dictated by proper specimen preparation and sample design procedures. We have developed a novel technique permitting the production of tensile specimens of multilayered films in cross‐section for in situ deformation studies. Of primary importance in the development of this technique is the production of an electron transparent micro‐gauge section. This micro‐gauge section predetermines the position at which plastic deformation, crack nucleation and growth, and failure are observed. In short, we report in detail, a unique combination of specimen preparation procedural steps and the design of a multilayer foil sample. The ability of these procedures to facilitate the success of in situ TEM tensile studies of layered materials in cross‐section is demonstrated using a Cu‐Zr multilayer foil. Microsc. Res. Tech. 36:143–150, 1997. © 1997 Wiley‐Liss, Inc.† This article is a US government work and, as such, is in the public domain in the Untited States of America.