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A security circuit for the image intensifier on the electron microscope
Author(s) -
Shih MinYi,
Hsu Tung
Publication year - 1996
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/(sici)1097-0029(19960815)34:6<554::aid-jemt7>3.0.co;2-j
Subject(s) - image intensifier , electron microscope , blank , microscope , cathode ray , optics , electron , materials science , physics , nuclear physics , composite material
While modifying a JEOL JEM‐100C microscope for UHV‐REM, we designed a security circuit to blank the electron beam so as not to damage the image intensifier accidentally. © 1996 Wiley‐Liss, Inc.