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Implications of specimen preparation and of surface contamination for the measurement of the grain boundary carbon concentration of steels using x‐ray microanalysis in an UHV FESTEM
Author(s) -
Cousens D. R.,
Wood B. J.,
Wang J. Q.,
Atrens A.
Publication year - 2000
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(200001)29:1<23::aid-sia689>3.0.co;2-y
Subject(s) - microanalysis , contamination , grain boundary , carbon fibers , electron probe microanalysis , x ray , materials science , analytical chemistry (journal) , metallurgy , radiochemistry , chemistry , environmental chemistry , electron microprobe , optics , physics , composite material , microstructure , organic chemistry , ecology , composite number , biology
The purpose of the present investigation was to gain an understanding of the nature of the carbon contamination on the surface of standard steel transmission electron spectroscopy (TEM) specimens, the effect of exposure of a clean specimen to normal laboratory air, and the efficacy of plasma‐cleaning treatments. This knowledge is a necessary prerequisite to the development of appropriate specimen preparation and/or specimen cleaning methods. X‐ray photoelectron spectroscopy in combination with argon ion beam profiling was used to characterize the specimen surfaces of X65 steel and 316 stainless steel. The only clean carbon‐free surface obtained was that during argon etching of the sample in the surface analysis chamber. Any exposure of a previously cleaned sample to laboratory air resulted in a rapid carbon (hydrocarbon) contamination of the sample surface and the development of surface oxidation. Plasma cleaning with subsequent exposure of the specimen to the laboratory air also resulted in a carbon‐contaminated surface. This suggests that procedures of preparation of TEM specimens of steels outside an ultrahigh vacuum chamber are unlikely to result in the lowering of contamination rates on specimens to levels where measurements for carbon in the grain boundaries are possible. What is needed is a cleaning system as an integral part of the specimen insertion system into the field‐emission scanning transmission electron microscope. This cleaning could be carried out by argon ion etching. Copyright © 2000 John Wiley & Sons, Ltd.