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Charge correction of the binding energy scale in XPS analysis of polymers using surface deposition of PDMS
Author(s) -
Burrell Michael C.,
Chera John J.
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199909)27:9<811::aid-sia636>3.0.co;2-w
Subject(s) - binding energy , x ray photoelectron spectroscopy , polymer , polyethylene , deposition (geology) , analytical chemistry (journal) , adsorption , materials science , silicone , surface energy , chemistry , chemical engineering , organic chemistry , composite material , atomic physics , physics , paleontology , sediment , engineering , biology
A method is described for correcting the binding energy scale for specimen charging that occurs during XPS analysis of insulating samples. A small quantity of polymeric poly (dimethyl silicone) (PDMS) is deposited from solution onto the surface of a series of polymers. After XPS analysis, the binding energy scale is then adjusted to align the Si 2p signal of the adsorbed PDMS to the value observed on conducting samples. A model is proposed that shows that the binding energies of insulating specimens are measured with respect to the sample Fermi level. Using this method, the C 1s binding energy for aliphatic hydrocarbon (CH 2 ) x in polyethylene is measured at 284.97 eV, in excellent agreement with previously reported values based on other correction schemes. Measured energies for 12 other materials are also presented. Copyright © 1999 John Wiley & Sons, Ltd.