Premium
AFM as a surface probe—beyond structural information
Author(s) -
Bai Chunli,
Li Junwei,
Lin Zhang,
Tang Jing,
Wang Chen
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199908)28:1<44::aid-sia615>3.0.co;2-3
Subject(s) - atomic force microscopy , scanning force microscopy , adhesion , nanotechnology , materials science , surface (topology) , polymer , surface force , microscopy , conductive atomic force microscopy , composite material , chemistry , optics , physics , mechanics , geometry , mathematics
We provide a general introduction to the recent progress made in microscopic studies using scanning force microscopy (SFM). The effects associated with adhesion, friction and lateral forces are analysed and utilized as a means of characterizing surface properties. It is demonstrated that contact mode atomic force microscopy (AFM) could be used to study quantitatively the friction of domains of molecular thin films, whereas tapping mode AFM is used to reveal the elastic behaviour of monodispersed polymer globules. Copyright © 1999 John Wiley & Sons, Ltd.