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Application of AES line shape analysis for the identification of interface species during the metallization of diamond particles
Author(s) -
Zhu Yongfa,
Yao Wenqing,
Zheng Bin,
Cao Lili
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199908)28:1<254::aid-sia588>3.0.co;2-e
Subject(s) - diamond , auger electron spectroscopy , layer (electronics) , materials science , metal , carbide , carbon fibers , material properties of diamond , diffusion , synthetic diamond , analytical chemistry (journal) , chemistry , metallurgy , nanotechnology , composite material , composite number , physics , chromatography , nuclear physics , thermodynamics
Auger electron spectroscopy (AES) has been used to investigate the interface diffusion and chemical reaction on the interface of a metal/diamond sample during the metallization of diamond particles. The results indicated that a Ti layer reacted with the diamond particles to form a TiC surface layer after the sample was annealed at 600 °C for 4 h. The diffusion process of carbon atoms from diamond substrate into the Ti layer was the key step for the formation of a TiC surface layer. A Cr metallization layer reacted with the diamond particles to form CrC and Cr 2 C 3 surface layers. The formation of the carbide layer was governed by the interface reaction. The CrC and Cr 2 C 3 species cannot be distinguished using Cr LMM line shape but it can be distinguished using Cr MVV line shape. The AES line shape analysis is useful for studying the interface reaction and identifying the interface species. Copyright © 1999 John Wiley & Sons, Ltd.