Premium
Depolarization near‐field scanning optical microscopy: influence of wavelength and tip shape on the lateral resolution
Author(s) -
von Freymann G.,
Wegener M.,
Schimmel Th.
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199905/06)27:5/6<499::aid-sia561>3.0.co;2-h
Subject(s) - near field scanning optical microscope , optics , resolution (logic) , wavelength , optical microscope , microscopy , near field optics , materials science , depolarization , near and far field , field (mathematics) , image resolution , physics , scanning electron microscope , computer science , mathematics , artificial intelligence , pure mathematics , endocrinology , medicine
We have demonstrated recently the operation of depolarizationnear‐field scanning optical microscopy(DP‐NSOM), a technique that allows opticalnear‐field imaging with uncoated optical fibre tips by makinguse of the depolarizing effect of the tip–samplenear‐field. We have shown both experimentally and by computersimulations that optical subwavelength resolution is obtained. Here,the dependence of the DP‐NSOM imaging contrast and resolutionon the wavelength and the tip shape is investigated in detail bycomputer simulations. We show explicitly that the resolution obtaineddoes not depend on the wavelength of light, thus demonstrating truenear‐field imaging. The results show that the DP‐NSOMimaging process does not depend critically on details of the shape ofthe fibre tip. Copyright © 1999 John Wiley & Sons, Ltd.