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Scanning near‐field cathodoluminescence microscopy on indented MgO crystal
Author(s) -
Pastré D.,
Troyon M.,
Duvaut T.,
Beaudoin J. L.
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199905/06)27:5/6<495::aid-sia485>3.0.co;2-i
Subject(s) - cathodoluminescence , scanning electron microscope , field emission microscopy , optics , materials science , microscope , optical microscope , scanning probe microscopy , resolution (logic) , microscopy , field electron emission , indentation , optoelectronics , luminescence , electron , diffraction , physics , composite material , quantum mechanics , artificial intelligence , computer science
The cathodoluminescence (CL) emission arising from theindentation of an MgO single crystal cleaved along (100)faces is investigated by scanning near‐fieldcathodoluminescence microscopy (SNCLM). This technique isperformed with a hybrid instrument that is a combination of ascanning force microscope, a scanning near‐field opticalmicroscope and a scanning electron microscope. The interest of thisinstrument is to allow one to obtain near‐field CL images, theresolution of which (∽100 nm) is at least an order ofmagnitude better than the resolution obtained with a classical CLimaging system (∽1 μm) using a conventionalscanning electron microscope. On the indented MgO, the CL emissionappears mainly localized in the deformed regions, especially in theslip bands created just around the indentation. These slip bands arerevealed only because of the high resolution of our hybrid system.Copyright © 1999 John Wiley & Sons, Ltd.