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Ellipsometric method in near‐field recording
Author(s) -
Bortchagovsky Eugene G.
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199905/06)27:5/6<482::aid-sia500>3.0.co;2-b
Subject(s) - ellipsometry , optics , polarization (electrochemistry) , field (mathematics) , physical optics , light field , materials science , physics , chemistry , thin film , nanotechnology , mathematics , pure mathematics
This article is devoted to the demonstration of the capability ofan ellipsometric detection method for near‐field opticalmeasurements. By numerical calculations different combinations ofillumination and detection applicable in near‐field opticswere analyzed. The obtained results show that the change in the stateof polarization of scattered light due to tip–protrusioninteraction is sufficient for detection in the most of the analyzedcases, even without resonant enhancement. This suggests thatellipsometry of scattered light may be used in near‐fieldoptics for the investigation of relevant systems of interest.Copyright © John Wiley & Sons, Ltd.