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Aspects of dynamic force microscopy on NaCl/Cu(111): resolution, tip–sample interactions and cantilever oscillation characteristics
Author(s) -
Bennewitz R.,
Bammerlin M.,
Guggisberg M.,
Loppacher C.,
Baratoff A.,
Meyer E.,
Güntherodt H.J.
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199905/06)27:5/6<462::aid-sia543>3.0.co;2-0
Subject(s) - cantilever , oscillation (cell signaling) , van der waals force , substrate (aquarium) , chemistry , atomic force microscopy , electrostatic force microscope , spectroscopy , non contact atomic force microscopy , analytical chemistry (journal) , force spectroscopy , resolution (logic) , resonance (particle physics) , nanotechnology , materials science , kelvin probe force microscope , atomic physics , physics , composite material , molecule , chromatography , biochemistry , quantum mechanics , artificial intelligence , computer science , oceanography , organic chemistry , geology
Ultrathin films of NaCl on Cu(111) have been studiedusing a dynamic force microscope. We present images with atomicresolution at step sites on the NaCl films. Force spectroscopymeasurements of the tip–sample interaction onNaCl‐covered areas and the Cu substrate are analysed withrespect to electrostatic, van der Waals and short‐rangecontributions. The interaction contrast between NaCl and Cu is shownto be reflected in the oscillation characteristics of the cantilever.First results of a resonance analysis with the help of a noveldigital oscillation control system are presented. Copyright ©1999 John Wiley & Sons, Ltd.