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Frequency‐modulation SFM imaging of DNA molecules in UHV conditions
Author(s) -
Maeda Yasushi,
Matsumoto Takuya,
Kawai Tomoji
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199905/06)27:5/6<450::aid-sia488>3.0.co;2-s
Subject(s) - scanning force microscopy , resolution (logic) , atomic force microscopy , modulation (music) , molecule , chemistry , frequency modulation , optics , nanotechnology , analytical chemistry (journal) , materials science , radio frequency , physics , acoustics , computer science , organic chemistry , chromatography , artificial intelligence , telecommunications
Dynamic mode scanning force microscopy with frequency‐shiftdetection has been employed for imaging single‐ anddouble‐stranded DNA under ultrahigh vacuum conditions. For thewet processes used to prepare the samples, the strong adhesion forceat the surface is observed even in ultrahigh vacuum conditions. TheDNA images can only be obtained with large frequency shifts, butprovide sufficient resolution to see the coil or higher‐orderstructures of the DNA molecules in detail. Because of the highsensitivity of the tip–sample interaction,frequency‐shift detection mode provides a higher qualitygrey‐scale resolution than tapping mode. In addition, contrastartefacts, which might include information on the detailed structure,are often observed, depending upon the feedback conditions. Copyright© 1999 John Wiley & Sons, Ltd.