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Surface potential studies of self‐assembling monolayers using Kelvin probe force microscopy
Author(s) -
Lü J.,
Eng L.,
Bennewitz R.,
Meyer E.,
Güntherodt H.J,
Delamarche E.,
Scandella L.
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199905/06)27:5/6<368::aid-sia530>3.0.co;2-w
Subject(s) - kelvin probe force microscope , monolayer , volta potential , dipole , microscopy , chemistry , self assembled monolayer , context (archaeology) , chemical physics , nanotechnology , molecule , atomic force microscopy , materials science , optics , physics , paleontology , organic chemistry , biology
The local contact potential difference (CPD) of differentself‐assembled n ‐alkanethiol monolayers on Ausubstrates has been measured using Kelvin probe force microscopy(KPFM). Our results demonstrate that KPFM can be used toobtain topography and CPD information simultaneously. The measuredCPDs show a clear chemical contrast, allowing us to distinguishbetween thiol molecules with different terminal groups. The CPDvalues of the same terminal group are found to vary with chainlength, which is explained in the context of the dipole layer model.Copyright © 1999 John Wiley & Sons, Ltd.