Premium
Dynamic friction force measurement with the scanning force microscope
Author(s) -
Krotil H.U.,
Weilandt E.,
Stifter Th.,
Marti O.,
Hild S.
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199905/06)27:5/6<341::aid-sia513>3.0.co;2-b
Subject(s) - amplitude , force dynamics , materials science , scanning force microscopy , scanning probe microscopy , non contact atomic force microscopy , kelvin probe force microscope , scanning electron microscope , composite material , atomic force microscopy , atomic force acoustic microscopy , normal force , phase (matter) , polymer , force spectroscopy , bending , nanotechnology , magnetic force microscope , mechanics , optics , chemistry , mechanical engineering , physics , engineering , magnetization , organic chemistry , quantum mechanics , magnetic field
The combination of scanning friction force microscopy(SFFM) with lock‐in techniques leads to dynamicscanning friction force microscopy (DSFFM) and providesgreat advantages in friction force studies. In the present worktheoretical considerations of DSFFM are proposed to obtainquantitative friction force values from quantitative friction forcevalues from qualitative friction force contrasts. Amplitude versusamplitude spectra and amplitude versus phase spectra are presented,obtained by measuring the amplitude and the phase signal of the(bending) scanning force contrasts by a simple method andsecond to determine quantitative static and kinetic friction forces.Two different polymer systems (polymer blend of 75%poly(allylaminehydrochloride) (PAA) and25% poly(diallyl‐dimethylammoniumchloride)(PDDAC) and a silicon surface with polyolefinecontamination) served as sample systems. Copyright © 1999John Wiley & Sons, Ltd.