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Soft x‐ray spectroscopy and imaging of interfacial chemistry in environmental specimens
Author(s) -
Tonner B. P.,
Droubay T.,
Denlinger J.,
MeyerIlse W.,
Warwick T.,
Rothe J.,
Kneedler E.,
Pecher K.,
Nealson K.,
Grundl T.
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199904)27:4<247::aid-sia553>3.0.co;2-m
Subject(s) - spectroscopy , x ray absorption spectroscopy , chemistry , x ray photoelectron spectroscopy , x ray spectroscopy , absorption spectroscopy , environmental chemistry , nanotechnology , chemical engineering , materials science , optics , physics , quantum mechanics , engineering
Interfaces between minerals and water, and minerals and microbes,are chemically complex and traditionally have been considered beyondthe capabilities of surface science techniques, except for modelsystems under controlled laboratory conditions. We report on someadvances in soft x‐ray spectroscopy and imaging that make itpossible to extract meaningful chemical information about interfacesof specimens that have complex histories, involving environmentalexposure. These measurements utilize x‐ray absorptionspectroscopy, in combination with spatial resolution, in a techniquecalled x‐ray spectromicroscopy. Examples are drawn fromattempts at Mn and Fe speciation of biologically produced minerals,bio‐corrosion deposits and clays. Copyright © 1999 JohnWiley & Sons, Ltd.

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