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EXAFS‐ and XANES‐like spectra obtained by x‐ray‐excited scanning tunneling microscope tip current measurement
Author(s) -
Tsuji Kouichi,
Wagatsuma Kazuaki,
Sugiyama Kazuaki,
Hiraga Kenji,
Waseda Yoshio
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199903)27:3<132::aid-sia491>3.0.co;2-d
Subject(s) - xanes , excited state , scanning tunneling microscope , extended x ray absorption fine structure , x ray , analytical chemistry (journal) , synchrotron radiation , scanning electron microscope , chemistry , x ray absorption fine structure , absorption (acoustics) , spectral line , microscope , materials science , absorption spectroscopy , atomic physics , optics , spectroscopy , nanotechnology , physics , chromatography , astronomy , quantum mechanics , composite material
As reported previously the tip current of a scanning tunnelingmicroscope (STM) is excited by irradiation of x‐rayson the sample. This x‐ray‐excited STM tip currentoriginates from electrons emitted from the sample surface. Wemeasured the STM tip current excited by synchrotron radiation forAu–Ni thin‐film samples as the x‐ray energy wasscanned near the Au L III and Ni K absorption edges. It was foundthat the STM tip current increased at the x‐ray energy nearthe absorption edge and extended x‐ray adsorption finestructure (EXAFS)‐like and x‐ray adsorptionnear‐edge structure (XANES)‐like spectra wereobtained. The experimental result using the tip coated with insulatorsuggested that the analysing area was ∽1.0 mm in diameter.Copyright © 1999 John Wiley & Sons, Ltd.