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Author(s)
Paynter R. W.
Publication year1999
Publication title
surface and interface analysis
Resource typeJournals
PublisherJohn Wiley & Sons
Abstract Coupons of polished aluminium, glass and polystyrene were exposedto radiofrequency (r.f.) plasmas containing helium,nitrogen and oxygen. Angle‐resolved XPS measurements of thetreated surfaces were made immediately, after a few days and afterabout 9 months. The data were interpreted in terms of a simplifiedsubstrate–overlayer model with allowance for fractionalcoverage. The results are consistent with surface cleaning followedby hydrocarbon re‐contamination for aluminium and glass, andwith the diffusion of adatoms towards the bulk in the case ofpolystyrene. Copyright © 1999 John Wiley & Sons, Ltd.
Subject(s)aluminium , analytical chemistry (journal) , chemical engineering , chemistry , composite material , diffusion , engineering , environmental chemistry , geology , helium , materials science , nitrogen , oceanography , organic chemistry , overlayer , physics , plasma , polymer , polystyrene , quantum mechanics , substrate (aquarium) , thermodynamics , x ray photoelectron spectroscopy
Language(s)English
SCImago Journal Rank0.52
H-Index90
eISSN1096-9918
pISSN0142-2421
DOI10.1002/(sici)1096-9918(199902)27:2<103::aid-sia477>3.0.co;2-1
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