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Combination of specular and off‐specular low‐angle x‐ray diffraction in the study of Co/Cu multilayers: mesoscopic structure and layer oxidation
Author(s) -
de Bernabé A.,
Capitán M. J.,
Fischer H. E.,
Quirós C.,
Prieto C.,
Colino J.,
Mompeán F.,
Sanz J. M.
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199901)27:1<1::aid-sia454>3.0.co;2-p
Subject(s) - specular reflection , mesoscopic physics , diffraction , oxide , layer (electronics) , materials science , crystallography , chemistry , condensed matter physics , optics , analytical chemistry (journal) , metallurgy , nanotechnology , physics , chromatography
The use of resonant low‐angle x‐ray diffraction,combining specular and off‐specular scans, has been used tocharacterize accurately and self‐consistently a set ofmagnetron‐sputtered Co/Cu multilayers. This study haspermitted their mesoscopic structure and quality of interfaces to bedetermined. Moreover, it has been observed that oxidation of theouter Co layer stops at the Co/Cu interface, whence no Cu oxideis produced. The cause of this is explained by the difference in theFermi energies between Co and Cu. © 1999 John Wiley & Sons,Ltd.