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Photoelectron spectroscopy versus absorption spectroscopy for quantitative characterization of nanometric powders coated with an overlayer
Author(s) -
SánchezLópez J. C.,
Fernández A.
Publication year - 1998
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199812)26:13<1016::aid-sia450>3.0.co;2-j
Subject(s) - overlayer , x ray photoelectron spectroscopy , x ray absorption spectroscopy , spectroscopy , absorption spectroscopy , analytical chemistry (journal) , materials science , absorption (acoustics) , electron energy loss spectroscopy , chemistry , nanotechnology , transmission electron microscopy , optics , nuclear magnetic resonance , composite material , physics , quantum mechanics , chromatography
For the present study we have considered powders made up of small particles (<1 μm) coated with a uniform overlayer. Different models have been developed to predict the elemental compositions in this kind of sample by x‐ray photoelectron spectroscopy (XPS) and absorption spectroscopies: electron energy‐loss spectroscopy (EELS) and x‐ray absorption spectroscopy (XAS). Isolated spherical or cubic particles, aggregated spherical particles and continuously layered models have been considered to take different possible textures of the samples into account. Theoretical curves have been compared to experimental data obtained for Al 2 O 3 /Al ultrafine powders made up of Al metal cores coated with an Al 2 O 3 overlayer. The dependence of both photoelectron and absorption spectroscopy analysis on overlayer thickness and sample texture as a function of particle size is discussed. © 1998 John Wiley & Sons, Ltd.