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Simple model for the XPS analysis of polysaccharide‐coated surfaces
Author(s) -
Morra Marco,
Cassinelli Clara
Publication year - 1998
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199809)26:10<742::aid-sia417>3.0.co;2-p
Subject(s) - x ray photoelectron spectroscopy , polysaccharide , adsorption , polymer , layer (electronics) , adhesion , chemistry , surface layer , chemical engineering , materials science , surface (topology) , analytical chemistry (journal) , nanotechnology , chromatography , organic chemistry , geometry , engineering , mathematics
A simple model was developed for the interpretation of results stemming from the XPS analysis of polymer surfaces modified by polyethyleneimine adsorption followed by surface coupling of polysaccharides. Theoretical surface compositions were evaluated from the calculated XPS intensity arising from a layered structure composed of a surface oxidized polymer, an intermediate polyethyleneimine layer and a top polysaccharide layer. Results of calculations were compared to analytical data obtained from fixed‐angle XPS analysis of polysaccharide‐coated surfaces and to the performances of the latter in in vitro cell adhesion experiments. It is shown that the model can correctly predict the relationship between the experimental surface composition and the cell‐resistant properties of polysaccharide‐coated surfaces. © 1998 John Wiley & Sons, Ltd.