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Determination of the inelastic mean free paths of electrons in copper and copper oxides by elastic peak electron spectroscopy (EPES)
Author(s) -
Lesiak B.,
Jablonski A.,
Zemek J.,
Jiricek P.
Publication year - 1998
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(19980501)26:5<400::aid-sia385>3.0.co;2-0
Subject(s) - inelastic mean free path , copper , electron , chemistry , mean free path , inelastic scattering , spectroscopy , analytical chemistry (journal) , range (aeronautics) , electron spectroscopy , atomic physics , materials science , scattering , physics , nuclear physics , optics , organic chemistry , chromatography , quantum mechanics , composite material
Theoretical values of the inelastic mean free path (IMFP) and their electron‐energy dependence are available in the literature from predictive formulae for various categories of materials, such as elemental solids, inorganic and organic compounds. in contrast, the experimental IMFP values were determined for a more limited number of materials. This refers especially to multicomponent solids. We have measured the IMFP dependence on energy for Cu and two copper oxides, CuO and Cu 2 O, using elastic peak electron spectroscopy. The experiment consisted of measuring the backscattering probabilities for the investigated materials and an Ni standard in the energy range 400–1600 eV. The IMFP values were determined using a theoretical model describing the phenomenon of elastic backscattering. The IMFP values determined in this work are in reasonable agreement with experimental and theoretical values published in the literature. © 1998 John Wiley & Sons, Ltd.