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Development of standards for surface analysis by ISO technical committee 201 on surface chemical analysis
Author(s) -
Powell C. J.,
Shimizu R.
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199710)25:11<860::aid-sia309>3.0.co;2-e
Subject(s) - standardization , auger electron spectroscopy , x ray photoelectron spectroscopy , work (physics) , technical standard , analytical chemistry (journal) , library science , engineering , political science , computer science , chemistry , chemical engineering , mechanical engineering , physics , environmental chemistry , law , nuclear physics
A summary is given of the organization and work of Technical Committee 201 on Surface Chemical Analysis of the International Organization for Standardization (ISO). Twelve potential international standards are currently in various stages of development and a further thirteen standards are expected to be developed shortly. Information is also given on expected future needs for standards with examples from a recent survey of experts in Auger electron spectroscopy and x‐ray photoelectron spectroscopy. © 1997 John Wiley & Sons, Ltd.

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