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Detection of Nylon‐6,6 Cyclic Monomers on Polymer Surfaces using Static SIMS
Author(s) -
Burrell Michael C.,
Chao Herbert S.I.,
Meerman Toob P.,
Peterson Gregory S.
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199709)25:10<799::aid-sia302>3.0.co;2-m
Subject(s) - monomer , nylon 6 , spectral line , polymer , mass spectrum , ion , analytical chemistry (journal) , quadrupole , chemistry , static secondary ion mass spectrometry , polymer chemistry , materials science , secondary ion mass spectrometry , chromatography , atomic physics , organic chemistry , physics , astronomy
The characteristic static SIMS spectra of the cyclic monomer of Nylon‐6,6 have been obtained from the isolated and purified material. The spectra are sufficiently different from those obtained from bulk Nylon‐6,6 polymer. Intense fragment ions corresponding to (M+H) + and (M‐H) − are observed in the positive and negative ion spectra, respectively. Results from both quadrupole and ToF‐SIMS measurements are presented. © 1997 by John Wiley & Sons, Ltd.