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Quantitative Study of Methyl Methacrylate–Poly(Ethylene Glycol) Methacrylate Copolymer Films using High Mass Resolution ToF‐SIMS
Author(s) -
Briggs D.,
Davies M. C.
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199708)25:9<725::aid-sia293>3.0.co;2-9
Subject(s) - copolymer , ethylene glycol , methacrylate , methyl methacrylate , resolution (logic) , monomer , polymer chemistry , secondary ion mass spectrometry , chemistry , analytical chemistry (journal) , x ray photoelectron spectroscopy , static secondary ion mass spectrometry , materials science , mass spectrometry , polymer , chemical engineering , chromatography , organic chemistry , artificial intelligence , computer science , engineering
A previous XPS and low mass resolution (quadrupole) SIMS study of methyl methacrylate–poly(ethylene glycol) methacrylate random copolymers indicated (by XPS) a surface composition close to that of the bulk, however the trends in SIMS intensity ratios for peaks chosen to represent the individual monomers showed departures from linearity that were not understood. High mass resolution time‐of‐flight (ToF) SIMS data has shed light on the earlier results and, as a result, linear correlations have been established. In addition it has been possible to study high mass fragments derived from the poly(ethylene glycol) side chain. © 1997 by John Wiley & Sons, Ltd.