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Calibration of the Probing Depth by Total Electron Yield of EXAFS Spectra in Oxide Overlayers (Ta 2 O 5 , TiO 2 , ZrO 2 )
Author(s) -
Jiménez V. M.,
Caballero A.,
Fernández A.,
SánchezLópez J. C.,
GonzálezElipe A. R.,
Trigo J. F.,
Sanz J. M.
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199708)25:9<707::aid-sia290>3.0.co;2-e
Subject(s) - x ray absorption spectroscopy , analytical chemistry (journal) , oxide , extended x ray absorption fine structure , absorption spectroscopy , yield (engineering) , spectral line , chemistry , electron , absorption (acoustics) , materials science , optics , physics , organic chemistry , chromatography , quantum mechanics , astronomy , metallurgy , composite material
Calibration of the probing depth by x‐ray absorption spectroscopy (XAS) in oxide materials is intended by measurement of the total electron yield (TEY) of electrons ejected by absorption of the radiation. Measurements have been carried out for three series of electrolytic metal oxide overlayers with different thickness. The experiments have been conducted at the Ti K, Ta L III and Zr K edges. Analysis of the XAS spectra is carried out by factor analysis and conventional Fourier transformation and fitting analysis. The data showed that the information depth by XAS follows the order ZrO 2 >TiO 2 >Ta 2 O 5 at the Ti K, Ta L III and Zr K edges. As an alternative, the absorption spectra of the same samples were measured in the conversion electron yield (CEY) mode: i.e. by measuring the current of He + ions produced by the ejected electrons in an atmosphere of He in contact with the sample. Here, the information depth is slightly different from that obtained by TEY. © 1997 by John Wiley & Sons, Ltd.