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STM‐induced Annealing and Nanoextrusion in nm‐Period Multilayers
Author(s) -
Gorbunov A. A.,
Richter J.,
Pompe W.,
Sewing A.,
Thomas J.
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199706)25:7/8<596::aid-sia284>3.0.co;2-p
Subject(s) - nanostructure , annealing (glass) , hillock , materials science , nanotechnology , scanning tunneling microscope , fabrication , nanometre , composite material , medicine , alternative medicine , pathology
Nanometre‐period nickel–carbon multilayers were used as a writing medium for nanostructure fabrication induced by gap voltage manipulations in a scanning tunnelling microscope. The choice of immiscible sample materials provided high‐stability written metallic structures. Two well‐distinguished hillock‐like nanostructure types were observed, depending on the tip–sample separation, polarity and interaction time. Relatively slow local annealing under positive sample potential without a direct tip–sample contact resulted in the formation of nanostructures of <20 nm wide and a few nanometres high. Rapid melting followed by metal melt extrusion was observed if the tip contacted the sample during the nanostructure formation, independent of the polarity of the applied voltage. These metallic‐like structures were tens of nanometres high and had a good electronic contrast to the initial carbon‐coated surface. No traces of tip material were found in the processed areas. The shape of the nanostructures and the threshold voltage of their formation were strongly dependent on the tip condition. Possible courses of nanostructure formation are discussed.© 1997 John Wiley & Sons, Ltd.