Premium
AFM and STM Characterization of TiO 2 —Ultrafiltration Membranes
Author(s) -
Beyer Dirk,
Richter Hannes,
Tomandl Gerhard
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199706)25:7/8<593::aid-sia277>3.0.co;2-q
Subject(s) - membrane , characterization (materials science) , atomic force microscopy , ultrafiltration (renal) , nanofiltration , nanotechnology , materials science , ceramic , chemical engineering , chemistry , chromatography , composite material , engineering , biochemistry
Atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) were used to investigate the surface of TiO 2 ultrafiltration membranes with pore sizes of 10 nm. It is widely accepted that conventional AFM with Si 3 N 4 or Si tips is not able to resolve pores in supported ceramic membranes with a diameter of <40 nm. In this study it should be tested whether it is possible to lower this border for further characterization of nanofiltration membranes. Here we present different ways of imaging and discuss alternative sample preparation techniques.© 1997 John Wiley & Sons, Ltd.