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Scanning Acoustic Force Microscope Investigations of Surface Acoustic Waves
Author(s) -
Hesjedal T.,
Chilla E.,
Fröhlich H.J.
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199706)25:7/8<569::aid-sia274>3.0.co;2-k
Subject(s) - surface acoustic wave , scanning acoustic microscope , cantilever , acoustic microscopy , diffraction , non contact atomic force microscopy , acoustic wave , transducer , acoustics , oscillation (cell signaling) , amplitude , standing wave , materials science , atomic force acoustic microscopy , microscope , optics , resolution (logic) , scanning probe microscopy , microscopy , physics , kelvin probe force microscope , magnetic force microscope , chemistry , magnetization , quantum mechanics , artificial intelligence , magnetic field , computer science , composite material , biochemistry
We report on the investigation of surface acoustic wave (SAW) fields by scanning acoustic force microscopy (SAFM), reaching submicron lateral resolution. The SAFM is based on a standard atomic force microscope and utilizes the non‐linear force curve in the sense of a mechanical diode. The surface oscillation therefore leads to a shift of the cantilever's rest position. With SAFM we investigated SAW transducers operating at frequencies above 600 MHz. We measured the dynamic behaviour of the wave pattern within the transducers when sweeping the frequency and found a local influence of mass loading on the standing SAW amplitude. Furthermore, the first images of SAW diffraction and scattering are shown.© 1997 John Wiley & Sons, Ltd.