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A Novel Method for Time‐resolved Characterization of Micromagnetic Stray Fields with Scanning Probe Microscopy
Author(s) -
Bangert J.,
Kasim S.,
Mertin W.,
Kubalek E.
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199706)25:7/8<533::aid-sia264>3.0.co;2-5
Subject(s) - scanning probe microscopy , magnetic field , demagnetizing field , image resolution , characterization (materials science) , resolution (logic) , temporal resolution , optics , stray light , resistive touchscreen , microscopy , scanning hall probe microscope , nuclear magnetic resonance , materials science , scanning electron microscope , physics , magnetization , scanning transmission electron microscopy , conventional transmission electron microscope , electrical engineering , computer science , quantum mechanics , artificial intelligence , engineering
Scanning probe microscopy is opening new applications in magnetic engineering due to superior resolution limits without any sample preparation under ambient conditions. In this paper we report time‐resolved magnetic stray field measurements based on a new type of probe to characterize magnetic fields. The probe used was a magneto‐resistive probe head fastened to a scanning probe microscope. The characteristics of the novel method are checked out on different test structures. In our experimental set‐up we have shown the ability of the novel method to characterize time‐dependent magnetic stray fields with micrometre spatial resolution and microtesla magnetic field resolution with kilohertz bandwidth. The experimental results reported are waveform measurements on distinct testpoints (zero‐dimensional), linescans (one‐dimensional) and two‐dimensional stray field distributions. Applications in three‐dimensional measurements are discussed.© 1997 John Wiley & Sons, Ltd.