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Monte Carlo Calculations of The Depth Distribution Function in Multilayered Structures
Author(s) -
Jackson A. R.,
El Gomati M. M.,
Matthew J. A. D.,
Cumpson P. J.
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199705)25:5<341::aid-sia242>3.0.co;2-h
Subject(s) - monte carlo method , auger electron spectroscopy , auger , impurity , materials science , copper , atomic number , computational physics , distribution function , statistical physics , molecular physics , chemistry , physics , atomic physics , mathematics , metallurgy , thermodynamics , quantum mechanics , statistics
The statistical‐weights Monte Carlo program of Cumpson for the calculation of depth distribution functions (DDF) has been extended in order to allow faster operation by use of a compiled language, C++, and the simulation of multilayer structures. The simulation of Auger electrons originating from a homogeneously distributed trace impurity has been performed for a number of thin films of different thickness and atomic numbers on substrates of different atomic number and of semi‐infinite thickness. The DDFs from bulk copper and gold samples and double and trilayer structures of carbon, copper and gold are presented. In both the bi‐ and trilayer structures it is found that the gradients of the DDF seem to switch fairly abruptly between the characteristics for each element at the boundary. © 1997 John Wiley & Sons, Ltd.