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Substrate Effects and Chemical State Plots for the XPS Analysis of Supported TiO 2 Catalysts
Author(s) -
Jiménez V. M.,
Lassaletta G.,
Fernández A.,
Espinós J. P.,
GonzálezElipe A. R.
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199704)25:4<292::aid-sia214>3.0.co;2-d
Subject(s) - x ray photoelectron spectroscopy , chemical state , auger , chemical shift , catalysis , binding energy , substrate (aquarium) , chemistry , characterization (materials science) , representation (politics) , analytical chemistry (journal) , materials science , atomic physics , nanotechnology , physics , organic chemistry , nuclear magnetic resonance , geology , oceanography , politics , political science , law
The analysis by XPS of TiO 2 deposited on different substrates (SiO 2 , MgO, Ag, SnO) shows the existence of shifts in the Ti 2p binding energy and Auger parameter values. The magnitude of these shifts is a function of the support and of the coverage. A systematic representation of these shifts is possible with a chemical state plot. The implications of the existence of such shifts for the characterization of catalysts are discussed. © 1997 by John Wiley & Sons, Ltd.