Premium
True Auger Electron Spectra Measured with a Novel Cylindrical Mirror Analyser (Au, Ag and Cu)
Author(s) -
Takeichi Y.,
Goto K.
Publication year - 1997
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199701)25:1<17::aid-sia206>3.0.co;2-0
Subject(s) - analyser , auger , auger electron spectroscopy , spectral line , atomic physics , ionization , chemistry , electron , spectroscopy , auger effect , secondary electrons , electron spectroscopy , analytical chemistry (journal) , physics , ion , nuclear physics , organic chemistry , chromatography , astronomy , quantum mechanics
A novel cylindrical mirror analyser (CMA) has been used to obtain true spectra using Auger electron spectroscopy (AES) on Au, Ag and Cu. The whole energy distribution for the primary accelerating voltages, ranging from 1 V through to 5000 V, was measured absolutely. Even faint spectra which have not been cited in Auger data books and only predicted by simple calculation were presented. Auger ionization cross‐sections of the M 4 and M 5 shells of Ag and the L 3 , M 1 and M 2,3 shells of Cu were deduced. The energy dependence of the elastically backscattered primary electrons was found to show strong material‐dependent characteristics. © 1997 by John Wiley & Sons, Ltd.