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Clean Surface and Oxidation Behavior of Vanadium Carbide, VC 0.75 (100)
Author(s) -
Antonik M. D.,
Lad R. J.,
Christensen T. M.
Publication year - 1996
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(19960930)24:10<681::aid-sia179>3.0.co;2-t
Subject(s) - x ray photoelectron spectroscopy , crystallite , electron diffraction , low energy electron diffraction , vanadium carbide , vanadium oxide , vanadium , oxide , analytical chemistry (journal) , materials science , vacancy defect , chemistry , diffraction , inorganic chemistry , chemical engineering , crystallography , metallurgy , optics , engineering , physics , chromatography
The clean single‐crystal VC 0.75 (100) surface, its oxidation, and the stability of the resulting oxide were examined with electron spectroscopy (AES, XPS and UPS), electron diffraction (low‐energy and reflection high‐energy electron diffraction) and atomic force microscopy (AFM). The clean VC 0.75 surface exhibits carbon vacancy‐related features in valence band spectroscopy data. This surface was exposed to O 2 at 500 °C for up to 10 000 Langmuirs. The oxidation leads to the formation of vanadium oxide, VO x (100), crystallites on the VC 0.75 (100) substrate. The AFM images indicate that oxide crystallites grow with an elongated shape along 〈 001 〉 type directions. When heated above 1000 °C, the oxide is unstable and a clean VC 0.75 (100) surface is produced.