Premium
Differential Charging in XPS. Part I: Demonstration of Lateral Charging in a Bulk Insulator Using Imaging XPS
Author(s) -
Tielsch Brian J.,
Fulghum Julia E.
Publication year - 1996
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199606)24:6<422::aid-sia142>3.0.co;2-g
Subject(s) - x ray photoelectron spectroscopy , insulator (electricity) , monochromatic color , spectral line , analytical chemistry (journal) , materials science , x ray , atomic physics , flux (metallurgy) , differential (mechanical device) , molecular physics , chemistry , optics , physics , optoelectronics , nuclear magnetic resonance , chromatography , astronomy , metallurgy , thermodynamics
Abstract Recent literature has drawn a distinction between charging across the surface (lateral differential charging) and charging with depth (vertical differential charging) for insulating samples. In this study, differential charging in a bulk insulator was investigated using imaging and small‐area spectra acquired with a monochromatic x‐ray source. With no charge neutralization, reproducible photoelectron images and spectra could be acquired from a glass sample after ∽90 min of x‐ray exposure. The charge shifts and photoelectron peak shapes vary as a function of x‐ray flux on the sample, indicating that lateral charging is the dominant mechanism on a bulk insulator. Uniform binding energies, photoelectron peak shapes and images are acquired with the charge neutralizer on.