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Surface Morphology of a PVC/PMMA Blend Studied by ToF‐SIMS
Author(s) -
Briggs D.,
Fletcher I. W.,
Reichlmaier S.,
AguloSanchez J. L.,
Short R. D.
Publication year - 1996
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199606)24:6<419::aid-sia132>3.0.co;2-y
Subject(s) - overlayer , secondary ion mass spectrometry , vinyl chloride , methyl methacrylate , morphology (biology) , materials science , polymer chemistry , polyvinyl chloride , analytical chemistry (journal) , ion , mass spectrometry , chemical engineering , chemistry , composite material , polymer , copolymer , chromatography , organic chemistry , biology , engineering , genetics
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) studies, utilizing both laterial imaging and shallow depth profiling, of a 50:50 poly(vinyl chloride)/poly(methyl methacrylate) (PVC:PMMA) blend have confirmed the presence of a thin overlayer of PMMA on the phase‐separated bulk morphology.