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Quantitative AES Analysis of Fracture Surfaces in the Presence of O‐ and C‐containing Residual Gas
Author(s) -
Otterbein U.,
Hofmann S.
Publication year - 1996
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199604)24:4<263::aid-sia114>3.0.co;2-k
Subject(s) - auger , auger electron spectroscopy , materials science , residual , analytical chemistry (journal) , grain boundary , oxygen , chemical composition , metallurgy , chemistry , microstructure , atomic physics , algorithm , physics , organic chemistry , chromatography , computer science , nuclear physics
The chemical composition of thin segregation layers is calculated using elemental Auger spectra and considering the adsorption of residual gas components during analysis. We take into account that the coverage with oxygen is different for the different elements in the thin layer and that the shape of the Auger peaks is changed by the coverage. Application of the method is demonstrated for quantitative analysis of in situ fractured grain boundaries of B‐doped Ni 3 Al bicrystals.