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XPS Imaging of Patterned Self‐assembled Monolayers Containing Perfluorinated Alkyl Chains
Author(s) -
Evans S. D.,
Flynn T. M.,
Ulman A.,
Beamson G.
Publication year - 1996
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199603)24:3<187::aid-sia102>3.0.co;2-k
Subject(s) - monolayer , x ray photoelectron spectroscopy , alkyl , self assembled monolayer , adsorption , yield (engineering) , self assembly , materials science , chemistry , chemical engineering , nanotechnology , crystallography , organic chemistry , engineering , metallurgy
X‐ray photoelectron spectroscopy ( E – X ) imaging has been applied to the study of perfluorinated self‐assembled monolayers (SAM) adsorbed on gold surfaces. Patterned monolayers were formed using a ‘stamping’ procedure which enabled the formation of ‘two‐component’ monolayers. The E – X images yield spatial information, with a30 μm resolution, on the quality and chemical composition of the resulting monolayer structures.