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Dissociation study of tellurium cluster ions, Te n + ( n = 25–85) using secondary ion mass spectrometry
Author(s) -
Ito Hiroyuki,
Matsuo Takekiyo,
Sato Takaya,
Ichiharai Toshio,
Katakuse Itsuo
Publication year - 2000
Publication title -
journal of mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 1076-5174
DOI - 10.1002/(sici)1096-9888(200002)35:2<168::aid-jms925>3.0.co;2-z
Subject(s) - chemistry , tellurium , ion , dissociation (chemistry) , mass spectrometry , fast atom bombardment , cluster (spacecraft) , mass spectrum , analytical chemistry (journal) , collision induced dissociation , atomic physics , tandem mass spectrometry , inorganic chemistry , physics , organic chemistry , chromatography , computer science , programming language
Dissociation pathways of tellurium clusters, Te n + ( n = 25–85), were investigated by secondary ion mass spectrometry. Positively charged ions were generated from a tellurium sheet by bombardment with 10 keV xenon ion beam. Mass analyses of cluster ions were performed using a grand‐scale sector mass spectrometer. In the first field‐free region, Te n + ( n = 25–80) had a large dissociation probability with five‐ and six‐atom emission and Te n + ( n = 50–85) had a slightly large dissociation probability with 10‐ and 11‐atom emission. Five‐ and six‐atom dissociation in the second field‐free region could be also observed. These results were most likely due to the cluster emission processes for Te n + , although sequential atom emission and cluster emission could not be distinguished by this type of experiments. Copyright © 2000 John Wiley & Sons, Ltd.