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Analysis of alkenes by copper ion chemical ionization gas chromatography/mass spectrometry and gas chromatography/tandem mass spectrometry
Author(s) -
Fordham P. J.,
ChamotRooke J.,
Giudice E.,
Tortajada J.,
Morizur J.P.
Publication year - 1999
Publication title -
journal of mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 1076-5174
DOI - 10.1002/(sici)1096-9888(199910)34:10<1007::aid-jms854>3.0.co;2-e
Subject(s) - chemistry , mass spectrometry , alkene , chemical ionization , adduct , gas chromatography , electron ionization , fast atom bombardment , ion source , mass spectrum , gas chromatography/tandem mass spectrometry , sample preparation in mass spectrometry , analytical chemistry (journal) , ion , tandem mass spectrometry , electrospray ionization , ionization , chromatography , organic chemistry , catalysis
A novel chemical ionization/fast atom bombardment (CI/FAB) source was used to analyse alkenes by chemical ionization mass spectrometry (CI‐MS) using copper ions as the ionizing agent. The Cu + ‐CI mass spectra showed abundant pseudomolecular adduct ions [alkene–Cu] + and characteristic fragment ions. Mass‐analysed ion kinetic energy spectroscopy was used to study the product ions resulting from the decomposition of adduct ions and to eliminate background interferences derived from the copper ions. The major fragmentations permitted the localization of double bonds and minor fragments allowed the differentiation of alkene isomers. The CI/FAB source was coupled to a gas chromatograph and simple and complex mixtures of octene isomers were analysed by gas chromatography (GC)/Cu + ‐CI‐MS and GC/Cu + ‐CI‐MS/MS. Copyright © 1999 John Wiley & Sons, Ltd.