Open AccessA generic approach to model complex system reliability using graphical duration models
Author(s) -
Roland Donat,
Laurent Bouillaut,
Patrice Aknin,
Philippe Leray,
Daniel Levy
Publication year - 2007
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - Uncategorized
Resource type - Conference proceedings
Subject(s) - graphical model , computer science , reliability (semiconductor) , bayesian network , variable elimination , context (archaeology) , probabilistic logic , duration (music) , process (computing) , variable (mathematics) , markov process , reliability theory , reliability engineering , complex system , bayesian probability , dynamic bayesian network , data mining , machine learning , artificial intelligence , mathematics , failure rate , engineering , statistics , programming language , literature , power (physics) , quantum mechanics , physics , mathematical analysis , biology , paleontology , inference , art