Open AccessCalibration of Scanning Electron Microscope using a multi-images non-linear minimization process.
Author(s) -
Le Cui,
Éric Marchand
Publication year - 2014
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - calibration , minification , scanning electron microscope , process (computing) , computer science , artificial intelligence , microscope , computer vision , materials science , optics , pattern recognition (psychology) , mathematics , physics , statistics , programming language , operating system