Open AccessGeneralized expressions of reliability of series-parallel and parallel-series systems using the Transferable Belief Model
Author(s) -
Felipe Aguirre,
Mohamed Sallak,
Walter Schön
Publication year - 2011
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - series (stratigraphy) , reliability (semiconductor) , computer science , series and parallel circuits , reliability theory , parallel computing , reliability engineering , engineering , paleontology , power (physics) , physics , quantum mechanics , voltage , failure rate , electrical engineering , biology