Open AccessA Built-In Self-Test Structure (BIST) for Resistive RAMs Characterization: Application to Bipolar OxRRAMs
Author(s) -
Hassen Aziza,
Marc Bocquet,
Mathieu Moreau,
JeanMichel Portal
Publication year - 2013
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - built in self test , resistive touchscreen , characterization (materials science) , computer science , embedded system , electronic engineering , electrical engineering , engineering , materials science , nanotechnology