
beta-risk: a New Surrogate Risk for Learning from Weakly Labeled Data
Author(s) -
Valentina Zantedeschi,
Rémi Emonet,
Marc Sebban
Publication year - 2016
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - margin (machine learning) , machine learning , artificial intelligence , computer science , support vector machine , reliability (semiconductor) , semi supervised learning , supervised learning , empirical risk minimization , noise (video) , artificial neural network , power (physics) , physics , quantum mechanics , image (mathematics)