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Towards accurate and efficient single fibre characterization to better assess failure strength distribution
Author(s) -
Faisal Islam,
Sébastien Joannès,
Steve Bucknell,
Yann Leray,
Anthony R. Bunsell,
Lucien Laiarinandrasana
Publication year - 2018
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - weibull distribution , ultimate tensile strength , reliability (semiconductor) , characterization (materials science) , population , computer science , materials science , reliability engineering , composite material , mathematics , statistics , engineering , nanotechnology , power (physics) , physics , demography , quantum mechanics , sociology

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