Open AccessPerformance Evaluation of Scanning Electron Microscopes using Signal-to-Noise Ratio.
Author(s) -
Naresh Marturi,
Sounkalo Dembélé,
Nadine Piat
Publication year - 2012
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - magnification , signal to noise ratio (imaging) , computer science , noise (video) , microscope , optics , artificial intelligence , computer vision , image (mathematics) , physics , telecommunications