The dark side of the wall: atomic force microscopy revelations on drug resistance and adhesion
Author(s) -
Hélène MartinYken,
Cécile FormosaDague,
Marion Schiavone,
Étienne Dague
Publication year - 2017
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - atomic force microscopy , adhesion , materials science , nanotechnology , optoelectronics , chemistry , composite material
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