Open AccessAssisted test generation strategy for non-intrusive machine learning indirect test of millimeter-wave circuits
Author(s) -
Florent Cilici,
Manuel J. Barragán,
Salvador Mir,
Estelle Lauga-Larroze,
Sylvain Bourdel
Publication year - 2018
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - test (biology) , extremely high frequency , computer science , electronic circuit , automatic test equipment , automatic test pattern generation , reliability engineering , electrical engineering , telecommunications , engineering , geology , paleontology , testability