
Bayesian Networks Implementation of the Dempster Shafer Theory to Model Reliability Uncertainty
Author(s) -
Christophe Simon,
Philippe Weber
Publication year - 2006
Publication title -
hal (le centre pour la communication scientifique directe)
Language(s) - English
Resource type - Conference proceedings
Subject(s) - dempster–shafer theory , bayesian network , reliability (semiconductor) , computer science , bayesian probability , artificial intelligence , reliability theory , machine learning , reliability engineering , data mining , engineering , power (physics) , physics , quantum mechanics , failure rate